Comprehensive electrical inspection for critical systems.
Chiplytics is developing cutting-edge inspection technology to quantify the authenticity and integrity of microelectronics. Our product uses Power Spectrum Analysis (PSA) to extensively evaluate homogeneity and identify outliers. Data acquisition is performed within milliseconds with minimal setup, enabling greater coverage and higher throughput.
How it works
Low voltage input stimulus applied to pins to capture unique response
Each unique response gets converted into a frequency-domain signature
Signatures are compared using principal component analysis to detect anomalies
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A simple analogy to PSA is if you were to ring a set of bells and listen carefully for subtle differences in resonance.
The Chiplytics PSA System
Hand-held module for running Power Spectrum Analysis (PSA)
POWER SPECTRUM ANALYSIS
A novel, patented electrical testing technique developed at Sandia National Laboratories rapidly performs a non-invasive electrical modal analysis to evaluate homogeneity and aging.
Sockets to interface any chip, produced by Chiplytics within a one-week turnaround. Reuse sockets for chips with the same footprint or return for future credit.
CROSS-PLATFORM DESKTOP APP
Operate the Chiplytics PSA module via USB from your Windows or Mac and view inspection results in realtime. The desktop app can also be used to operate the system offline.
SECURE CLOUD CONNECTIVITY
Dive deeper into test results using the Chiplytics web app. Data collected across devices can be leveraged to improve detection accuracy and identify trends.
Collect power signatures to evaluate homogeneity among a batch of components
Compare signatures against a golden sample or run more extensive testing (e.g. destructive) on a subset to verify authenticity of the entire batch
Capture the power signature profile of a reference component as it’s aged to evaluate the health of future components (after being stored, used, or recycled)
Achieve high-volume quality assurance
Chiplytics inspection technology could be used to rapidly test entire reels or trays of semiconductors to ensure that all components going into high-volume products are authentic and defect-free.