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Microelectronics Inspection Platform
Automate AS6171 Electrical Inspection

The Chiplytics MIP (Microelectronics Inspection Platform) enables distributors to run AS6171 electrical testing in-house. Components are loaded using standard JEDEC trays or placed freely on the ESD mat and automatically detected, probed, and electrically tested. Setup and analysis is assisted remotely by Chiplytics.
MIP V3 Demo
Two self-aligning probes run electrical tests on each chip including Power Spectrum Analysis (PSA), continuity testing, and pin-to-pin IV curve tracing.
Socketless Interface
Test a wide range of ICs and custom footprints
The Chiplytics MIP uses machine vision to automatically align probes with device pins, enabling a wide range of packages to be tested immediately without needing custom socket adapters.​


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