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The Micro Inspection Platform (MIP)

Automate Electrical Inspection of Packaged Microelectronics

The Chiplytics MIP enables in-house AS6171 electrical testing. Components are loaded using standard JEDEC trays or placed freely on an ESD mat for automatic detection, interfacing, and electrical testing without requiring custom sockets. Chiplytics remote setup and analysis available as a service.

Two self-aligning probes run electrical testing including Power Spectrum Analysis (PSA), continuity testing, and pin-to-pin IV curve tracing.

Socketless Interface
Test a wide range of ICs and custom footprints 

The Chiplytics MIP uses machine vision to automatically align probes with device pins, enabling a wide range of packages to be tested on-demand without custom socket adapters.​

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